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Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization (Paperback)

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization Cover Image
By Fred Stevie
$79.95
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Description

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

About the Author

Senior Researcher, North Carolina State University

Product Details
ISBN: 9781606505885
ISBN-10: 1606505882
Publisher: Momentum Press
Publication Date: September 15th, 2015
Pages: 277
Language: English
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